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Lab manual for Electronic Devices, Global Edition

Lab manual for Electronic Devices, Global Edition

10th Edition

Thomas Floyd

Jun 2018, Paperback, 288 pages
ISBN13: 9781292249346
ISBN10: 129224934X
For orders to USA, Canada, Australia, New Zealand or Japan visit your local Pearson website
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This laboratory manual is carefully coordinated to the text Electronic Devices, Tenth edition, Global edition, by Thomas L. Floyd. The seventeen experiments correspond to the chapters in the text (except the first experiment references Chapters 1 and the first part of Chapter 2). All of the experiments are subdivided into two or three “Parts.” With one exception (Experiment 12-B), the Parts for the all experiments are completely independent of each other. The instructor can assign any or all Parts of these experiments, and in any order. This format provides flexibility depending on the schedule, laboratory time available, and course objectives. In addition, experiments 12 through 16 provide two options for experiments. These five experiments are divided into two major sections identified as A or B. The A experiments continue with the format of previous experiments; they are constructed with discrete components on standard protoboards as used in most electronic teaching laboratories. The A experiments can be assigned in programs where traditional devices are emphasized. Each B experiment has a similar format to the corresponding A experiment, but uses a programmable Analog Signal Processor (ASP) that is controlled by (free) Computer Aided Design (CAD) software from the Anadigm company ( These experiments support the Programmable Analog Design feature in the textbook. The B experiments are also subdivided into independent Parts, but Experiment 12-B, Part 1, is a software tutorial and should be performed before any other B experiments. This is an

excellent way to introduce the ASP technology because no other hardware is required other

than a computer running the downloaded software. In addition to Experiment 12-B, the first 13 steps of Experiment 15-B, Part 2, are also tutorial in nature for the AnadigmFilter program. This is an amazing active filter design tool that is easy to learn and is included with the AnadigmDesigner2 (AD2) CAD software. The ASP is part of a Programmable Analog Module (PAM) circuit board from the Servenger company ( that interfaces to a personal computer.

The PAM is controlled by the AD2 CAD software from the Anadigm company website. Except for Experiment 12-B, Part 1, it is assumed that the PAM is connected to the PC and AnadigmDesigner2 is running. Experiment 16-B, Part 3, also requires a spreadsheet program such as Microsoft® Excel®. The PAM is described in detail in the Quick Start Guide (Appendix B). Instructors may choose to mix A and B experiments with no loss in continuity, depending on course objectives and time. We recommend that Experiment 12-B,Part 1, be assigned if you want students to have an introduction to the ASP without requiring a hardware purchase.

A text feature is the Device Application (DA) at the end of most chapters. All of the DAs have a related laboratory exercise using a similar circuit that is sometimes simplified to make laboratory

time as efficient as possible. The same text icon identifies the related DA exercise in the lab manual.

One issue is the trend of industry to smaller surface-mount devices, which are very difficult to work with and are not practical for most lab work. For example, almost all varactors are supplied as surface mount devices now. In reviewing each experiment, we have found components that can illustrate the device function with a traditional one. The traditional through-hole MV2109 varactor is listed as obsolete, but will be available for the foreseeable future from Electronix Express (, so it is called out in Experiment 3. All components are available from Electronix Express ( as a kit of parts (see list in Appendix A). The format for each experiment has not changed from the last edition and is as follows:

· Introduction: A brief discussion about the experiment and comments about each of the independent Parts that follow.

· Reading: Reading assignment in the Floyd text related to the experiment.

· Key Objectives: A statement specific to each Part of the experiment of what the student should be able to do.

· Components Needed: A list components and small items required for each Part but not including the equipment found at a typical lab station. Particular care has been exercised to select materials that are readily available and reusable, keeping

cost at a minimum.

· Parts: There are two or three independent parts to each experiment. Needed tables, graphs, and figures are positioned close to the first referenced location to avoid confusion. Step numbering starts fresh with each Part, but figures and tables are numbered sequentially for the entire experiment to avoid multiple figures with

the same number.

§ Conclusion: At the end of each Part, space is provided for a written conclusion.

§ Questions: Each Part includes several questions that require the student to draw upon the laboratory work and check his or her understanding of the concepts. Troubleshooting questions are frequently presented.

· Multisim Simulation: At the end of each A experiment (except #1), one or more circuits are simulated in a Multisim computer simulation. New Multisim troubleshooting problems have been added to this edition. Multisim troubleshooting files are identified with the suffix

f1, f2, etc., in the file name (standing for fault1, fault2, etc.). Other files, with nf as the suffix include demonstrations or practice using instruments such as the Bode Plotter and the Spectrum Analyzer. A special icon is shown with all figures that are related to the Multisim simulation. Multisim files are found on the website: Microsoft PowerPoint® slides are available at no cost to instructors for all experiments. The slides reinforce the experiments with troubleshooting questions and a related problem and are available on the instructor’s resource site.

Each laboratory station should contain a dual-variable regulated power supply, a function generator, a multimeter, and a dual-channel oscilloscope. A list of all required materials is given in Appendix A along with information on acquiring the PAM. As mentioned, components are also available as a kit from Electronix Express; the kit number is 32DBEDFL10.

Table of contents


Experiment 1 Introduction to Semiconductors

Part 1: The Diode Characteristic Curve

Part 2: Plotting Diode Curves with an Oscilloscope

Experiment 2 Diodes and Applications

Part 1: Diode Rectifiers

Part 2: Diode Clipping Circuits

Part 3: Diode Clamping Circuits

Multisim Simulation

Experiment 3 Special-Purpose Diodes

Part 1: The Zener Diode and Regulator

Part 2: The Varactor Diode

Part 3: Light-Emitting Diode and Photodiode

Multisim Simulation

Experiment 4 Bipolar Junction Transistors

Part 1: The BJT Characteristic Curve

Part 2: BJT Switching Circuits

Multisim Simulation

Experiment 5 Transistor Bias Circuits

Part 1: Three Bias Circuits

Part 2: Emitter Bias and Two-Supply Voltage-Divider Bias

Multisim Simulation

Experiment 6 BJT Amplifiers

Part 1: The Common-Emitter Amplifier

Part 2: The Common-Collector Amplifier

Part 3: Multistage Amplifiers

Multisim Simulation

Experiment 7 BJT Power Amplifiers

Part 1: The Class-A Power Amplifier

Part 2: The Class-B Power Amplifier

Multisim Simulation

Experiment 8 Field-Effect Transistors (FETs)

Part 1: JFET Characteristic Curve

Part 2: The JFET as a Voltage-Controlled Resistor

Part 3: The JFET as a DC Amplifier

Multisim Simulation

Experiment 9 FET Amplifiers and Switching Circuits

Part 1: The Common-Source JFET Amplifier

Part 2: The Common-Drain JFET Amplifier

Part 3: A Cascode Amplifier

Multisim Simulation

Experiment 10 Amplifier Frequency Response

Part 1: Low-Frequency Response

Part 2: High-Frequency Response

Multisim Simulation

Experiment 11 Thyristors

Part 1: The SCR

Part 2: The Unijunction Transistor

Multisim Simulation

Experiment 12 The Operational Amplifier

Experiment 12-A The Operational Amplifier

Part 1: The Differential Amplifier

Part 2: Op-Amp Specifications

Part 3: Basic Op-Amp Circuits

Multisim Simulation

Experiment 12-B Programmable Analog Design

Part 1: Introduction to AnadigmDesigner2

Part 2: Downloading the Configuration File

Experiment 13 Basic Op-Amp Circuits

Experiment 13-A Basic Op-Amp Circuits

Part 1: The Comparator and Schmitt Trigger

Part 2: The Summing Amplifier

Part 3: The Integrator and Differentiator

Multisim Simulation

Experiment 13-B Programmable Analog Design

Part 1: The Comparator and Comparator with Hysteresis

Part 2: The Summing Amplifier and Peak Detector

Part 3: The Differentiator

Experiment 14 Special Purpose Integrated Circuits

Experiment 14-A Special Purpose Integrated Circuits

Part 1: The Instrumentation Amplifier

Part 2: The Log Amplifier and Antilog Amplifier

Multisim Simulation

Experiment 14-B Programmable Analog Design

Part 1: Single-Ended Signals into a Differential Signal Circuit

Part 2: Instrumentation CAMs

Experiment 15 Active Filters

Experiment 15-A Active Filters

Part 1: Four-pole Low-Pass Filter

Part 2: State-Variable Filter

Multisim Simulation

Experiment 15-B Programmable Analog Design

Part 1: Single-Pole Low-Pass Filter Using the Bilinear Filter CAM

Part 2: Single-Pole Low-Pass Filter Using AnadigmFilter

Part 3: Chebyshev Band-Pass Filter Using AnadigmFilter

Experiment 16 Oscillators

Experiment 16-A Oscillators

Part 1: The Wien Bridge Oscillator

Part 2: The Hartley and Colpitts Oscillators

Part 3: The 555 Timer

Optional Investigation: Modulated Source

Multisim Simulation

Experiment 16-B Programmable Analog Design

Part 1: Ring Oscillators

Part 2: The Sine Wave Oscillator

Part 3: The Arbitrary Waveform Generator

Experiment 17 Voltage Regulators

Part 1: The Series Regulator

Part 2: IC Regulators

Multisim Simulation

Appendix A:

List of Materials for the Experiments

Appendix B:

Quick Start Guide for the Programmable Analog Module